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Atomic Force Microscopy: Fundamental Concepts and...

Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

Wesley C. Sanders (Author)
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This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.

种类:
年:
2019
出版:
1
出版社:
CRC Press
语言:
english
ISBN 10:
0429266553
ISBN 13:
9781000707946
文件:
PDF, 7.18 MB
IPFS:
CID , CID Blake2b
english, 2019
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