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The physics and modeling of MOSFETS: surface-potential...

The physics and modeling of MOSFETS: surface-potential model HiSIM

Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ezaki
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This volume provides a timely description of the latest compact MOS transistor models for circuit simulation. The first generation BSIM3 and BSIM4 models that have dominated circuit simulation in the last decade are no longer capable of characterizing all the important features of modern sub-100nm MOS transistors. This book discusses the second generation MOS transistor models that are now in urgent demand and being brought into the initial phase of manufacturing applications. It considers how the models are to include the complete drift-diffusion theory using the surface potential variable in the MOS transistor channel in order to give one characterization equation.

Contents:

  • Semiconductor Device Physics
  • Basic Compact Surface-Potential Model of the MOSFET
  • Advanced MOSFET Phenomena Modeling
  • Capacitances
  • Leakage Currents and Junction Diode
  • Modeling of Phenomena Important for RF Applications
  • Summary of HiSIM s Model Equations, Parameters, and Parameter-Extraction Method.

种类:
年:
2008
出版社:
World Scientific
语言:
english
页:
381
ISBN 10:
9812568646
ISBN 13:
9789812568649
系列:
International Series on Advances in Solid State Electronics International Series on Advances in Solid State Electronics and Technology Asset
文件:
PDF, 32.17 MB
IPFS:
CID , CID Blake2b
english, 2008
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