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Microscopy of Materials: Modern Imaging Methods Using...

Microscopy of Materials: Modern Imaging Methods Using Electron, X-ray and Ion Beams

D. K. Bowen, C. R. Hall (auth.)
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种类:
Engineering
年:
1975
出版社:
Macmillan Education UK
语言:
english
页:
313
ISBN 10:
1349156019
ISBN 13:
9781349156016
文件:
PDF, 32.96 MB
IPFS:
CID , CID Blake2b
english, 1975
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关键词

 
electron
specimen
contrast
surface
microscope
figure
electrons
microscopy
crystal
materials
ray
lens
wave
diffraction
analysis
scanning
plane
intensity
diffracted
method
shown
waves
methods
emission
dislocation
atoms
fringes
angle
scattering
transmission
fault
techniques
instrument
planes
dislocations
effect
absorption
obtained
incident
orientation
range
rays
aperture
microprobe
optical
screen
atomic
microanalysis
crystals
topography
exp
specimens
bragg
depth
effects
lenses
grain
magnetic
distance
reflection