Aberration-corrected Analytical Electron Microscopy (RMS - Royal Microscopical Society)
Rik Brydson
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
年:
2011
出版:
1
出版社:
Wiley
语言:
english
页:
296
ISBN 10:
0470518510
ISBN 13:
9780470518519
文件:
PDF, 5.22 MB
IPFS:
,
english, 2011
Amazon 
Barnes & Noble 
Bookshop.org 
转换文件
更多搜索结果
其他特权 
